Structural characterization techniques for nanomaterials and applications
The exponential growth in recent years of nanotechnologies has required the development of new nanomaterials with physical properties tailored to specific applications. Structural characterization techniques represent the first fundamental step to observe and understand nanomaterial properties and develop new frontier devices in all fields of science and technology. The symposium focuses on the advances in optoelectronic and electronic device technology based on nanoparticles and two-dimensional materials. Optical spectroscopy, scanning probe microscopy and electron microscopy will prove to be powerful tools for investigating optical properties, morphology and structural properties of nanomaterials.