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  The Co-organizers list is provisional and updated on April 18th, 2019. Others Co-organizers will be added, accordingly to the progress of event organization.

Park Systems

Park Logo High Resolution

Advances in surface electrical characterization at the nanoscale by using
Scanning Kelvin probe microscopy (SKPM)

Atomic Force Microscopy (AFM) Seminar and Live Demo

12th June 2019
Faculty of Civil and Industrial Engineering - Sapienza University of Rome

foto PARK

Figure capture: 10x10 µm2 image of a polymer-patterned array. Topography image (left), FM-SKPM image (center), and AM-SKPM image (right).


MORNING PROGRAMME:

09:00     Welcome and Introduction

09:10     Talk: “Advances in surface electrical characterization at the nanoscale by using Scanning Kelvin probe microscopy (SKPM)

09:30   Instrument Demonstration on Park NX10 AFM

10:30   Discussion und Summary

 

AFTERNOON PROGRAMME:

14:00   Welcome and Introduction

14:10   Talk: “Advances in surface electrical characterization at the nanoscale by using Scanning Kelvin probe microscopy (SKPM)

14:30   Instrument Demonstration on Park NX10 AFM

15:30   Discussion und Summary

 

ABSTRACT

Scanning Kelvin Probe microscopy (SKPM) allows measuring work function and electrical potential distribution of various materials, to provide a better understanding of nanostructures and CMOS semiconductor devices to improve their performance. SKPM has also been used to determine quantitative information such as the charge distribution in polymer materials. Compared to other techniques, SKPM is nondestructive and compatible to ambient conditions. Conventional Amplitude Modulation (AM) SKPM has already allowed remarkable enhancements in the field of device reliability, but it is limited by its signal-to-noise detection ability. For this scope Park Systems recently developed Frequency Modulation FM-SKPM. The results show that FM-SKPM is significantly more sensitive than AM-SKPM in measuring surface potential distribution.

In this workshop we will demonstrate that FM-SKPM has better sensitivity in detecting surface potential variation of polymer material in comparison to AM-SKPM. In fact, FM-SKPM provided higher resolution with sharper edges of the domains and detected smaller potential variations than AM-SKPM on the same irregular surface.

 

SPEAKER INFORMATION:

Dr. Andrea Cerreta – Application Scientist at Park Systems
This email address is being protected from spambots. You need JavaScript enabled to view it. | www.parksystems.com

foto NX10

Park NX10 AFM

 

ORGANIZERS

 

AIRI

 

Ass NanoItaly

 

NANOINNOVATION'S
GOT TALENT


call for young researchers
by BRACCO FOUNDATION

 marchioFondazioneBracco pos

 

SCIENTIFIC PATRONAGES

 

SCI

 

 

 

INSTITUTIONAL PATRONAGES

 

Logo Ufficiale MAECI

Ministero della Difesa

 MIPAAFT

Regione Lazio

 

INSTITUTIONAL PARTNERS

 

APRE

 

ITA ICE COMPOSTO

logo OIR

 

IN COOPERATION WITH

 

PLATINUM nuovo

 

 

Organizing Secretariat

Dr. Cristina Gippa

+ 39 339 771 4107
+ 39 388 1785318

This email address is being protected from spambots. You need JavaScript enabled to view it.

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